The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2022

Filed:

Dec. 24, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Supriyo Chakraborty, White Plains, NY (US);

Omer Tripp, Bronx, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01); H04L 9/40 (2022.01); G06N 7/00 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
H04L 63/1433 (2013.01); G06F 11/3676 (2013.01); G06F 11/3684 (2013.01); G06N 7/005 (2013.01);
Abstract

Techniques for performing root cause analysis in dynamic software testing via probabilistic modeling are provided. In one example, a computer-implemented method includes initializing, by a system operatively coupled to a processor, a threshold value, a defined probability value, and a counter value. The computer-implemented method also includes, in response to determining, by the system, that a probability value assigned to a candidate payload of one or more candidate payloads exceeds the defined probability value, and in response to determining, by the system, that the counter value exceeds the threshold value: determining, by the system, that a match exists between the candidate payload and an input point based on an application of the candidate payload to the input point resulting in a defined condition, wherein the one or more candidate payloads are represented by population data accessed by the system.


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