The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2022

Filed:

Apr. 14, 2020
Applicant:

Wuxi Huaying Microelectronics Technology Co., Ltd, Wuxi, CN;

Inventors:

Sophia Wen, Wuxi, CN;

Zhikai Wang, Wuxi, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/67 (2006.01); H01L 21/02 (2006.01); H01L 21/66 (2006.01); B08B 3/08 (2006.01);
U.S. Cl.
CPC ...
H01L 21/6704 (2013.01); B08B 3/08 (2013.01); H01L 21/02 (2013.01); H01L 21/02238 (2013.01); H01L 21/67 (2013.01); H01L 21/67017 (2013.01); H01L 21/6719 (2013.01); H01L 21/67023 (2013.01); H01L 21/67028 (2013.01); H01L 21/67051 (2013.01); H01L 21/67057 (2013.01); H01L 22/20 (2013.01);
Abstract

A semiconductor processing apparatus is provided. The apparatus includes a body portion, which includes at least one semiconductor processing unit. Each semiconductor processing unit includes a recess formed on an upper surface of the body portion, wherein a bottom surface of the recess has at least one location and a peripheral. The bottom surface ascends from the at least one location toward the peripheral against a direction of gravity or descends from the at least one location toward the peripheral following the direction of gravity. Each semiconductor processing unit also includes a first channel that connects to the recess at the at least one location, as well as at least one second channel connecting to the recess at the peripheral. Each of the first channel and the at least one second channel serves as an inlet or an outlet via which a fluid enters or exits the recess. A method according to the present disclosure may control a flowing direction of a fluid flowing across a substrate surface. When the fluid flow as programmed, the fluid may contact the substrate surface and process the surface via various physical and/or chemical reactions.


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