The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2022

Filed:

Nov. 26, 2019
Applicant:

Educational Testing Service, Princeton, NJ (US);

Inventors:

Xinhao Wang, San Carlos, CA (US);

Keelan Evanini, Pennington, NJ (US);

Yao Qian, Dublin, CA (US);

Klaus Zechner, Princeton, NJ (US);

Assignee:

Educational Testing Service, Princeton, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G10L 15/26 (2006.01); G10L 15/197 (2013.01); G10L 25/51 (2013.01); G10L 15/16 (2006.01);
U.S. Cl.
CPC ...
G10L 15/26 (2013.01); G10L 15/16 (2013.01); G10L 15/197 (2013.01); G10L 25/51 (2013.01);
Abstract

Data is received that encapsulates a spoken response to a test question. Thereafter, the received data is transcribed into a string of words. The string of words is then compared with at least one source string so that a similarity grid representation of the comparison can be generated that characterizes a level of similarity between the string of words and the at least one source string. The grid representation is then scored using at least one machine learning model. The score indicates a likelihood of the spoken response having been plagiarized. Data providing the encapsulated score can then be provided. Related apparatus, systems, techniques and articles are also described.


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