The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2022

Filed:

Feb. 13, 2020
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Yuncong Chen, Plainsboro, NJ (US);

Dongjin Song, Princeton, NJ (US);

Haifeng Chen, West Windsor, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/00 (2022.01); G06V 20/10 (2022.01); G06V 10/22 (2022.01); G06V 10/143 (2022.01);
U.S. Cl.
CPC ...
G06V 20/188 (2022.01); G06V 10/143 (2022.01); G06V 10/22 (2022.01); G06V 20/194 (2022.01);
Abstract

Systems and methods for anomaly detection are provided. The method includes structuring a multi-channel spatial-temporal sequence as a four-dimensional array. The method also includes decomposing the four-dimensional array to form a low-rank component representing a background signal and a residual component representing anomalies for each time point of the multi-channel spatial-temporal sequence. The method further includes determining a sequence of anomaly maps by stacking the residual components at all time points together. Anomalies are identified based on the sequence of anomaly maps.


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