The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2022

Filed:

Feb. 16, 2018
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Kousuke Ishida, Tokyo, JP;

Hajime Ishikawa, Tokyo, JP;

Shinji Oominato, Tokyo, JP;

Shunsuke Akimoto, Tokyo, JP;

Masami Sakaguchi, Tokyo, JP;

Shintaro Matsumoto, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/00 (2022.01); G06V 20/10 (2022.01); G06K 9/62 (2022.01); G06V 30/194 (2022.01);
U.S. Cl.
CPC ...
G06V 20/188 (2022.01); G06K 9/6269 (2013.01); G06V 30/194 (2022.01);
Abstract

A vegetation index calculation apparatus () is provided with a learning model generation unit () that generates a learning model, by using an image of a crop targeted for calculation of a vegetation index and an image of plants other than the crop to learn a feature amount of the image of the crop, an image acquisition unit () that acquires an aerial image of a target region where the crop is being grown, a specification unit () that applies the aerial image acquired by the image acquisition unit () to the learning model generated by the learning model generation unit (), and specifies the image of the crop in the aerial image acquired by the image acquisition unit (), and a vegetation index calculation unit () that calculates the vegetation index of the crop, using the image of the crop specified by the specification unit ().


Find Patent Forward Citations

Loading…