The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2022

Filed:

Oct. 05, 2020
Applicant:

Pictometry International Corp., Rochester, NY (US);

Inventors:

Yandong Wang, Webster, NY (US);

Frank Giuffrida, Honeoye Falls, NY (US);

Assignee:

Pictometry International Corp., Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2022.01); G06V 10/44 (2022.01); G06V 10/56 (2022.01); G06V 20/64 (2022.01); G06V 20/10 (2022.01); G06T 7/50 (2017.01); G06T 7/73 (2017.01); G06K 9/00 (2022.01);
U.S. Cl.
CPC ...
G06V 10/44 (2022.01); G06K 9/00536 (2013.01); G06K 9/6221 (2013.01); G06T 7/50 (2017.01); G06T 7/73 (2017.01); G06V 10/56 (2022.01); G06V 20/176 (2022.01); G06V 20/64 (2022.01); G06T 2207/10032 (2013.01); G06T 2207/30184 (2013.01);
Abstract

Automated methods and systems for feature extraction are disclosed, including automated methods performed by at least one processor running computer executable instructions stored on at least one non-transitory computer readable medium, comprising determining and isolating an object of interest within a point cloud; forming a modified point cloud having one or more data points with first location coordinates of the object of interest; and generating a boundary outline having second location coordinates of the object of interest using spectral analysis of at least one section of at least one image identified with the first location coordinates and depicting the object of interest.


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