The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2022
Filed:
Apr. 29, 2020
Curacloud Corporation, Seattle, WA (US);
Feng Gao, Seattle, WA (US);
Hao-Yu Yang, Seattle, WA (US);
Youbing Yin, Kenmore, WA (US);
Yue Pan, Seattle, WA (US);
Xin Wang, Seattle, WA (US);
Junjie Bai, Seattle, WA (US);
Yi Wu, Seattle, WA (US);
Kunlin Cao, Kenmore, WA (US);
Qi Song, Seattle, WA (US);
KEYAMED NA, INC., Seattle, WA (US);
Abstract
Embodiments of the disclosure provide systems and methods for biomedical image analysis. A method may include receiving a plurality of unannotated biomedical images, including a first image and a second image. The method may also include determining that the first image is in a first view and the second image is in a second view. The method may further include assigning the first image to a first processing path for the first orientation. The method may additionally include assigning the second image to a second processing path for the second view. The method may also include processing the first image in the first processing path in parallel with processing the second image in the second processing path. The first path may share processing parameters with the second path. The method may further include providing a diagnostic output based on the processing of the first image and the second image.