The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2022

Filed:

Apr. 13, 2020
Applicants:

International Business Machines Corporation, Armonk, NY (US);

New York University, New York, NY (US);

Inventors:

Hsin-Hao Yu, Mount Waverley, AU;

Stefan Renard Maetschke, Ascot Vale, AU;

Suman Sedai, Hughesdale, AU;

Bhavna Josephine Antony, Brunswick East, AU;

Rahil Garnavi, Macleod, AU;

Hiroshi Ishikawa, Edgewater, NJ (US);

Assignees:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 7/00 (2017.01); A61B 3/14 (2006.01); A61B 3/10 (2006.01); A61B 3/00 (2006.01); A61B 3/024 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); A61B 3/0025 (2013.01); A61B 3/024 (2013.01); A61B 3/102 (2013.01); A61B 3/145 (2013.01); G06T 2207/10101 (2013.01); G06T 2207/30041 (2013.01);
Abstract

Aspects of the invention include a computer implemented method for simulating visual field test results from structural scans, the method includes processing eye image data to extract visual functioning related features. Additionally, generating a representation of a visual function of the eye that is independent of a visual field test (VFT) configuration. Then generating a simulated VFT configuration specific test result based at least in part on the representation.


Find Patent Forward Citations

Yu, Hsin-Hao. (2022). Simulating visual field test from structural scans (U.S. Patent No. 11416986). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11416986

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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