The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2022

Filed:

Aug. 20, 2018
Applicant:

Veracode, Inc., Burlington, MA (US);

Inventors:

Asankhaya Sharma, Singapore, SG;

Yaqin Zhou, Singapore, SG;

Assignee:

VERACODE, INC., Burlington, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01); G06N 7/00 (2006.01); G06N 99/00 (2019.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06N 7/005 (2013.01); G06N 20/00 (2019.01); G06F 2221/034 (2013.01);
Abstract

A system to create a stacked classifier model combination or classifier ensemble has been designed for identification of undisclosed flaws in software components on a large-scale. This classifier ensemble is capable of at least a 54.55% improvement in precision. The system uses a K-folding cross validation algorithm to partition a sample dataset and then train and test a set of N classifiers with the dataset folds. At each test iteration, trained models of the set of classifiers generate probabilities that a sample has a flaw, resulting in a set of N probabilities or predictions for each sample in the test data. With a sample size of S, the system passes the S sets of N predictions to a logistic regressor along with 'ground truth' for the sample dataset to train a logistic regression model. The trained classifiers and the logistic regression model are stored as the classifier ensemble.


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