The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2022

Filed:

Sep. 22, 2020
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Yiwen Zhu, San Francisco, CA (US);

Alekh Jindal, Sammamish, WA (US);

Malay Kumar Bag, Kirkland, WA (US);

Hiren Shantilal Patel, Bothell, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/2453 (2019.01); G06N 20/00 (2019.01); G06F 16/2458 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24542 (2019.01); G06F 16/2477 (2019.01); G06F 16/24539 (2019.01); G06N 20/00 (2019.01);
Abstract

Techniques are described herein that are capable of selecting checkpoints of a database job. For instance, at compile time, temporal indicators associated with the query plans of the database job are determined. Each temporal indicator indicates first and second subsets of stages of the respective query plan. Values of attributes of each stage in at least each first subset are predicted using a machine learning technique. At the compile time, candidate stage(s) for each query plan are identified based on the respective candidate stage being a child of stage(s) in the corresponding second subset or not being a child of another stage in the respective query plan. The candidate stage(s) for each query plan are selectively chosen as respective checkpoint(s) based on whether the values of the attributes of each stage in at least the first subset of the stages of the respective query plan satisfy one or more criteria.


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