The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2022
Filed:
Nov. 21, 2019
Harness Inc., San Francisco, CA (US);
Sriram Parthasarathy, Fremont, CA (US);
Raghvendra Singh, Fremont, CA (US);
Parnian Zargham, Santa Clara, CA (US);
Rishikesh Singh, Sunnyvale, CA (US);
Jyoti Bansal, San Francisco, CA (US);
Harness Inc., San Francisco, CA (US);
Abstract
A system can monitor applications and analyze the metrics to determine if one or more of the applications are regressing or performing as expected. The metric analysis includes performing a first short term data analysis and, if data is not as expected, a second short term analysis based on machine learning-based pattern recognition machines. If the short-term analysis finds the metrics aren't as expected, a long-term analysis is performed. The long-term analysis can compare chunks of streaming metric data to cached metric blocks and historical data, and can include a concept drift analysis.