The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2022
Filed:
May. 13, 2020
Oracle International Corporation, Redwood Shores, CA (US);
Paria Rashidinejad, Berkeley, CA (US);
Navaneeth Jamadagni, South San Francisco, CA (US);
Arun Raghavan, San Francisco, CA (US);
Craig Schelp, Vancouver, CA;
Charles Gordon, Davis, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Techniques are described herein for accurately measuring the reliability of storage systems. Rather than relying on a series of approximations, which may produce highly optimistic estimates, the techniques described herein use a failure distribution derived from a disk failure data set to derive reliability metrics such as mean time to data loss (MTTDL) and annual durability. A new framework for modeling storage system dynamics is described herein. The framework facilitates theoretical analysis of the reliability. The model described herein captures the complex structure of storage systems considering their configuration, dynamics, and operation. Given this model, a simulation-free analytical solution to the commonly used reliability metrics is derived. The model may also be used to analyze the long-term reliability behavior of storage systems.