The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2022

Filed:

Feb. 03, 2020
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Toshifumi Minemoto, Kyoto, JP;

Reiko Hattori, Kyoto, JP;

Yuya Ota, Kyotanabe, JP;

Shinsuke Kawanoue, Kyoto, JP;

Akira Nakajima, Otsu, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/048 (2013.01); G05B 19/418 (2006.01); G06F 3/0482 (2013.01); G06F 3/14 (2006.01);
U.S. Cl.
CPC ...
G05B 19/41875 (2013.01); G06F 3/0482 (2013.01); G06F 3/14 (2013.01); G05B 2219/32368 (2013.01);
Abstract

A display system is provided in production equipment that has driving means and monitoring means, having controllable features. The display system includes a control unit, a display unit, a storage unit, and an input unit. The storage unit stores: the features output over time from one or more of the driving means and the monitoring means; and causal relationship model data in which one or more causal factors of one or more abnormalities that can occur in the production equipment are selected from among the driving means and the monitoring means and expressed as a causal relationship model in association with a relationship between the causal factors. The control unit displays, on the display unit, the causal factors of the individual abnormalities, the one or more features corresponding to the causal factors, and changes over time in the features.


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