The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2022

Filed:

Mar. 09, 2018
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Hisaya Wakayama, Tokyo, JP;

Masatsugu Ogawa, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G05B 19/41865 (2013.01); G05B 19/4183 (2013.01); G05B 19/41805 (2013.01); G05B 19/41885 (2013.01);
Abstract

An evaluation target period acquiring unit acquires an evaluation target period based on an evaluation timing included by evaluation index information that includes at least an evaluation index to be evaluated and the evaluation timing of the evaluation index. A control target extracting unit extracts a control target whose control timing is included in the evaluation target period as a first control target from control target information that includes at least the control target to be the target of a control plan in an operation and the control timing of each control target. A control planning unit calculates the control plan maximizing the evaluation index with the first control target as a variable and state information that is information necessary for calculation of a control achievement at a time of planning and the control plan, as a constraint condition.


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