The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2022
Filed:
Oct. 31, 2018
Amlogic (Shanghai) Co., Ltd., Shanghai, CN;
Other;
Abstract
The present invention relates to processor testing technology, specifically relating to a method for automatically testing a processor, the method comprising: S, carrying out test preparation; S, setting an operation voltage and a clock frequency of a processor to be tested; S, carrying out load testing at the current operation voltage and clock frequency; S, determining whether the processor is normal during current load testing; if yes, then turning to step S; if no, then raising the current operation voltage by a first growth value and returning to step S; and S, recording an operation voltage, subject to load testing, which corresponds to the current clock frequency as a test result and determining whether the current clock frequency reaches an upper limit; if yes, then ending the operation; if no, then raising the current clock frequency by a second growth value and returning to step S. The described method is capable of implementing the automatic testing of processors and rapidly and effectively obtaining operation voltages corresponding to clock frequencies when the processors are operating normally, and is thus suitable for a plurality of platforms.