The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2022
Filed:
Jan. 29, 2018
Shimadzu Corporation, Kyoto, JP;
Hiroshi Arai, Kyoto, JP;
Masato Hirade, Kyoto, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
A scanning probe microscopeis provided with a control unitThe control unitincludes a signal acquisition processing unitan image acquisition processing unita scanning condition change processing unita scanning processing unitand a noise determination processing unitIn the scanning probe microscopewhen removing noise included in a surface image of a sample, the scanning condition change processing unitchanges a scanning condition. And, the signal acquisition processing unitacquires an output signal from a detection unitThe image acquisition processing unitacquires a surface image of a sample S based on the output signal. The noise determination processing unitdetermines whether or not noise is inclined in the output signal contains noise based on the change in the output signal or the change in the surface image of the sample S when the scanning condition is changed by the scanning condition change processing unitTherefore, if noise is included in the output signal, it is possible to correctly determinate the fact.