The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2022
Filed:
May. 28, 2020
Schott Schweiz Ag, St. Gallen, CH;
Igor Sosman, St. Gallen, CH;
Christian Kläger, Abtwil, CH;
Dominik Eugster, Oberuzwil, CH;
Stefanie Julia Willmann, St. Gallen, CH;
SCHOTT SCHWEIZ AG, St. Gallen, CH;
Abstract
A method for detecting and classifying defects in high-throughput transparent articles such as syringes, vials, cartridges, ampules, and bottles is provided. The method includes the steps of providing a stream of the articles; capturing a first digital image of each of the articles in the stream; inspecting the first digital image for objects; determining parameters of the objects; performing a first classification step to classify the objects into a first defect class and a second defect class; performing a second classification step to classify the objects into a plurality of defect types using at least two second classification models; comparing at least one object parameter of a classified object with a predetermined defect type dependent threshold; classifying the article as defective or non-defective based on the comparing step; and separating defective articles from non-defective articles.