The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2022
Filed:
Sep. 05, 2017
Syracuse University, Syracuse, NY (US);
Joseph Chaiken, Fayetteville, NY (US);
Jerry Goodisman, Syracuse, NY (US);
Syracuse University, Syracuse, NY (US);
Abstract
The invention provides a method of determining turbidity and concentration simultaneously a sample by irradiating the sample with a single incident wavelength and simultaneously measuring wavelength shifted (IE) and unshifted (EE) light emitted. A relative volume of light emitted from two phases may be determined, wherein the two phases comprise a first Rayleigh and Mie scattering and fluorescent phase associated with suspended particles, and a second, non-scattering but fluorescent phase associated with suspending solution. Volumes of the phases and/or concentrations of specific fluorophores or Raman active species are calculated from the volume of light emitted by the first phase relative to the total volume of light emitted from the first and second phases.