The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2022

Filed:

Oct. 06, 2017
Applicant:

Horiba, Ltd., Kyoto, JP;

Inventors:

Tetsuya Mori, Kyoto, JP;

Hirosuke Sugasawa, Kyoto, JP;

Keijiro Sakuramoto, Kyoto, JP;

Tetsuji Yamaguchi, Kyoto, JP;

Assignee:

HORIBA, LTD., Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/10 (2006.01); G01N 15/02 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0211 (2013.01); G01N 15/0272 (2013.01); G01N 15/10 (2013.01); G01N 2015/1087 (2013.01);
Abstract

The particle size distribution measurement device irradiates light onto a sample of particles, then detects secondary light generated by this irradiation, and then calculates a particle size distribution of the particles based on the detection data, and includes a separate measurement data receiving unit that receives separate measurement data obtained by separately measuring particles having a specific particle size in a separate sample, and light intensity data showing a light intensity of the secondary light generated by the particles in the separate sample, and a distribution conversion unit that, based on the separate measurement data and on the light intensity data, converts the particle size distribution from a distribution in which the numbers of particles of each particle size contained in the sample being measured are shown in relative terms to a distribution in which the numbers of these particles are shown in absolute terms.


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