The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2022
Filed:
Oct. 15, 2020
Institute of Rock and Soil Mechanics, Chinese Academy of Sciences, Wuhan, CN;
Dawei Hu, Wuhan, CN;
Jinliang Song, Wuhan, CN;
Guoping Zhang, Wuhan, CN;
Hui Zhou, Wuhan, CN;
Jianfu Shao, Wuhan, CN;
Chuanqing Zhang, Wuhan, CN;
Fanjie Yang, Wuhan, CN;
Jingjing Lu, Wuhan, CN;
Yong Zhu, Wuhan, CN;
Yang Gao, Wuhan, CN;
Fan Zhang, Wuhan, CN;
Other;
Abstract
The present disclosure discloses a rock high-stress high-temperature micro-nano indentation test system, comprising: an X, Y, Z three-direction macroscopic adjustment module, an indentation precision loading module, an indentation test module and an indentation data processing module. The rock high-stress high-temperature micro-nano indentation test system further comprise a two-dimensional horizontal stress loading device, a temperature control device and a vacuum device. The rock high-stress high-temperature micro-nano indentation test system provided by the present disclosure has distinctive features of modularity and structuralization, and its test results have high accuracy. The rock high-stress high-temperature micro-nano indentation test system is easy to operate, and provides a theoretical and technical system support for testing the mechanical characteristics of the rock under the high-stress and high-temperature environment in the deep region.