The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2022

Filed:

May. 31, 2019
Applicant:

Flir Systems Ab, Täby, SE;

Inventors:

Henning Hagman, Täby, SE;

Marta Barenthin-Syberg, Stockholm, SE;

Assignee:

FLIR Systems AB, Täby, SE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/10 (2006.01); G01J 5/00 (2022.01); G01J 5/02 (2022.01); G02B 5/20 (2006.01); H04N 5/33 (2006.01); G01J 3/36 (2006.01); G01N 21/3504 (2014.01); G01J 5/03 (2022.01); G01J 5/0802 (2022.01);
U.S. Cl.
CPC ...
G01J 5/10 (2013.01); G01J 3/36 (2013.01); G01J 5/0014 (2013.01); G01J 5/027 (2013.01); G01J 5/03 (2022.01); G01J 5/0802 (2022.01); G01N 21/3504 (2013.01); G02B 5/208 (2013.01); H04N 5/33 (2013.01); G01J 2005/106 (2013.01); G01N 2021/3531 (2013.01);
Abstract

Improved techniques for thermal imaging and gas detection are provided. In one example, a system includes a first set of filters configured to pass first filtered infrared radiation comprising a first range of thermal wavelengths associated with a background portion of a scene. The system also includes a second set of filters configured to pass second filtered infrared radiation comprising a second range of thermal wavelengths associated with a gas present in the scene. The first and second ranges are independent of each other. The system also includes a sensor array comprising adjacent infrared sensors configured to separately receive the first and second filtered infrared radiation to capture first and second thermal images respectively corresponding to the background portion and the gas. Additional systems and methods are also provided.


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