The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2022

Filed:

Mar. 26, 2018
Applicant:

Hewlett-packard Development Company, L.p., Spring, TX (US);

Inventors:

Peter Morovic, Sant Cugat del Valles, ES;

Jan Morovic, London, GB;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/46 (2006.01); G01J 3/50 (2006.01); G01J 5/08 (2022.01); G01J 3/00 (2006.01); G01J 3/28 (2006.01); G01J 3/52 (2006.01);
U.S. Cl.
CPC ...
G01J 3/462 (2013.01); G01J 3/00 (2013.01); G01J 3/46 (2013.01); G01J 3/50 (2013.01); G01J 5/0846 (2013.01); G01J 3/463 (2013.01); G01J 3/524 (2013.01); G01J 2003/283 (2013.01); G01J 2003/467 (2013.01);
Abstract

Certain examples relate to emulating a spectral measurement device in a color measurement apparatus. In these examples, a primary spectral measurement device measures a first spectral characteristic of a rendered color output. A predictive model, parametrized by parameter values, is applied to the measurement from the primary spectral measurement device to determine a predicted measurement of a second spectral characteristic of the rendered color output which would be measured by an ancillary spectral measurement device. Parameter values are generated by training the predictive model with data from the primary spectral measurement device and the ancillary spectral measurement device.


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