The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2022

Filed:

May. 21, 2019
Applicant:

Topcon Corporation, Tokyo-to, JP;

Inventors:

Fumio Ohtomo, Saitama, JP;

Kaoru Kumagai, Tokyo-to, JP;

Tetsuji Anai, Tokyo-to, JP;

Assignee:

TOPCON Corporation, Tokyo-to, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 15/00 (2006.01); G01C 15/06 (2006.01); G01S 7/481 (2006.01); G01C 11/02 (2006.01); G06T 7/70 (2017.01);
U.S. Cl.
CPC ...
G01C 15/004 (2013.01); G01C 11/025 (2013.01); G01C 15/008 (2013.01); G01C 15/06 (2013.01); G01S 7/4817 (2013.01); G06T 7/70 (2017.01);
Abstract

A surveying instrument comprises a monopod installed at a reference point, a surveying instrument main body provided at the monopod and having an attitude detector, wherein the surveying instrument main body carries out an image pickup and a scanning of an object to be measured at a pre-movement and a post-movement respectively, obtains at least three cross points of a locus of a scan pattern of the pre-movement and the post-movement, and calculates three-dimensional coordinates of an installation point of the post-movement based on three-dimensional coordinates of the cross points measured from the reference point, a measurement result of the cross points measured from the installation point of the post-movement and a detection result of the attitude detector.


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