The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2022
Filed:
Sep. 26, 2018
Renishaw Plc, Wotton-under-Edge, GB;
Jamie John Buckingham, Plymouth, GB;
Michael John Wooldridge, Stroud, GB;
Ben Richard Holden, Bristol, GB;
Stephen Peter Ewen, Erlestoke, GB;
RENISHAW PLC, Wotton-under-Edge, GB;
Abstract
A measurement probe is described that includes a probe body, a stylus that is deflectable relative to the probe body, and a plurality of sensor elements for generating a sensor signal indicative of stylus deflection. An analyser is provided, optionally as part of a trigger unit, to analyse the sensor signals and issues a trigger signal to indicate the stylus has contacted an object. The analyser is arranged to combine a plurality of the sensor signals to generate a resultant deflection signal for comparison to a deflection threshold and is also arranged to detect oscillatory motion of the stylus by analysing at least one of the sensor signals. The analyser only issues a trigger signal when the resultant deflection signal crosses the deflection threshold and no oscillatory motion of the stylus is detected. The measurement probe may be used on a machine tool or other coordinate positioning apparatus.