The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2022

Filed:

Aug. 24, 2020
Applicant:

Cognex Corporation, Natick, MA (US);

Inventors:

David Y. Li, West Roxbury, MA (US);

Li Sun, Sudbury, MA (US);

Lowell D. Jacobson, Grafton, MA (US);

Lei Wang, Wayland, MA (US);

Assignee:

Cognex Corporation, Natick, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/03 (2006.01); G06T 7/521 (2017.01); H04N 5/235 (2006.01); G06T 11/00 (2006.01); G06T 17/00 (2006.01); G06T 7/593 (2017.01);
U.S. Cl.
CPC ...
G01B 11/03 (2013.01); G06T 7/521 (2017.01); G06T 7/596 (2017.01); G06T 11/00 (2013.01); G06T 17/00 (2013.01); H04N 5/2353 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/10144 (2013.01);
Abstract

This invention provides a system and method for selecting the correct profile from a range of peaks generated by analyzing a surface with multiple exposure levels applied at discrete intervals. The cloud of peak information is resolved by comparison to a model profile into a best candidate to represent an accurate representation of the object profile. Illustratively, a displacement sensor projects a line of illumination on the surface and receives reflected light at a sensor assembly at a set exposure level. A processor varies the exposure level setting in a plurality of discrete increments, and stores an image of the reflected light for each of the increments. A determination process combines the stored images and aligns the combined images with respect to a model image. Points from the combined images are selected based upon closeness to the model image to provide a candidate profile of the surface.


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