The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2022
Filed:
Dec. 03, 2019
Applicant:
Fujitsu Component Limited, Tokyo, JP;
Inventors:
Assignee:
FUJITSU COMPONENT LIMITED, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 3/1061 (2020.01); G01B 3/1056 (2020.01); G01B 3/1043 (2020.01); G01B 3/1007 (2020.01); G01B 3/1005 (2020.01);
U.S. Cl.
CPC ...
G01B 3/1061 (2013.01); G01B 3/1007 (2020.01); G01B 3/1043 (2020.01); G01B 3/1056 (2013.01); G01B 2003/103 (2013.01); G01B 2003/1015 (2013.01);
Abstract
A measuring instrument that reads a measure including a plurality of reading patterns arranged in a length direction of the measure, each reading pattern including a plurality of patterns arranged in a width direction of the measure, includes: a flattening member that increases a flatness of the measure; and a first reader that optically reads the plurality of patterns arranged in the width direction included in a single reading pattern from the measure in a state where the flatness is increased by the flattening member.