The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2022
Filed:
Mar. 27, 2015
Hesheng Liu, Marblehead, MA (US);
Danhong Wang, Belmont, MA (US);
Randy L. Buckner, Newton, MA (US);
Hesheng Liu, Marblehead, MA (US);
Danhong Wang, Belmont, MA (US);
Randy L. Buckner, Newton, MA (US);
The General Hospital Corporation, Boston, MA (US);
Abstract
A system and method for measuring a functional lateralization of a subject brain is provided. The method includes providing a set of functional magnetic resonance imaging (fMRI) data acquired during a resting state of a subject, and selecting a plurality of seed voxels associated with locations in hemispheres of a brain of the subject. The method also includes determining a degree of within-hemisphere connectivity for each seed voxel using the fMRI data, determining a degree of cross-hemisphere connectivity for each seed voxel using the fMRI data, and computing an autonomy index for each seed voxel using the degree of within-hemisphere connectivity and the degree of cross-hemisphere connectivity, wherein the autonomy index is indicative of a connectivity asymmetry between the hemispheres. The method further includes generating a report indicative of a specialization profile determined for a region of interest in the brain of the subject.