The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2022

Filed:

May. 15, 2017
Applicant:

University of Southern California, Los Angeles, CA (US);

Inventors:

Krishna Shrinivas Nayak, Long Beach, CA (US);

Yi Guo, Los Angeles, CA (US);

Robert Marc Lebel, Calgary AB, CA;

Yinghua Zhu, San Jose, CA (US);

Sajan Goud Lingala, Los Angeles, CA (US);

Assignee:

University of Southern California, Los Angeles, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/055 (2006.01); G01R 33/56 (2006.01); A61B 5/00 (2006.01); G01R 33/563 (2006.01); G01R 33/561 (2006.01);
U.S. Cl.
CPC ...
A61B 5/055 (2013.01); A61B 5/0042 (2013.01); A61B 5/7257 (2013.01); G01R 33/5601 (2013.01); G01R 33/56366 (2013.01); G01R 33/5611 (2013.01);
Abstract

Tracer kinetic models are utilized as temporal constraints for highly under-sampled reconstruction of DCE-MRI data. The method is flexible in handling any TK model, does not rely on tuning of regularization parameters, and in comparison to existing compressed sensing approaches, provides robust mapping of TK parameters at high under-sampling rates. In summary, the method greatly improves the robustness and ease-of-use while providing better quality of TK parameter maps than existing methods. In another embodiment, TK parameter maps are directly reconstructed from highly under-sampled DCE-MRI data. This method provides more accurate TK parameter values and higher under-sampling rates. It does not require tuning parameters and there are not additional intermediate steps. The proposed method greatly improves the robustness and ease-of-use while providing better quality of TK parameter maps than conventional indirect methods.


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