The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2022
Filed:
Dec. 21, 2020
Amazon Technologies, Inc., Seattle, WA (US);
Emilio Ian Maldonado, Seattle, WA (US);
Daniel Bibireata, Seattle, WA (US);
Nishitkumar Ashokkumar Desai, Redmond, WA (US);
Yasser Baseer Asmi, Redmond, WA (US);
Xiaofeng Ren, Yarrow Point, WA (US);
Jaechul Kim, Seattle, WA (US);
Amazon Technologies, Inc., Seattle, WA (US);
Abstract
Sensors in a facility generate sensor data associated with a region of the facility, which can be used to determine a 3D location of an object in the facility. Some sensors may sense overlapping regions of the facility. For example, a first sensor may generate data associated with a first region of the facility, while a second sensor may generate data associated with a second region of the facility that partially overlaps the first region. Sensors may fail at times as determined from sensor output data or status data. In response to identifying a failed sensor, an undetected region corresponding to the failed sensor is identified, as well as a substitute sensor that partially senses the undetected region. Sensor data from the substitute sensor, such as 2D data, is acquired and used to estimate a 3D location of an object in the undetected region.