The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2022
Filed:
Oct. 16, 2019
General Electric Company, Schenectady, NY (US);
Mustafa Tekin Dokucu, Latham, NY (US);
Subhrajit Roychowdhury, Schenectady, NY (US);
Olugbenga Anubi, Niskayuna, NY (US);
Masoud Abbaszadeh, Clifton Park, NY (US);
Justin Varkey John, Schenectady, NY (US);
GENERAL ELECTRIC COMPANY, Schenectady, NY (US);
Abstract
An industrial asset may have monitoring nodes that generate current monitoring node values. An abnormality detection computer may determine that an abnormal monitoring node is currently being attacked or experiencing fault. A dynamic, resilient estimator constructs, using normal monitoring node values, a latent feature space (of lower dimensionality as compared to a temporal space) associated with latent features. The system also constructs, using normal monitoring node values, functions to project values into the latent feature space. Responsive to an indication that a node is currently being attacked or experiencing fault, the system may compute optimal values of the latent features to minimize a reconstruction error of the nodes not currently being attacked or experiencing a fault. The optimal values may then be projected back into the temporal space to provide estimated values and the current monitoring node values from the abnormal monitoring node are replaced with the estimated values.