The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2022

Filed:

Aug. 24, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Amitkumar Manoharrao Paradkar, Mohegan Lake, NY (US);

Pooja Aggarwal, Bangalore, IN;

Atri Mandal, Bangalore, IN;

Ajay Gupta, New Delhi, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 41/0677 (2022.01); H04L 41/069 (2022.01);
U.S. Cl.
CPC ...
H04L 41/0677 (2013.01); H04L 41/069 (2013.01);
Abstract

Methods, systems, and computer program products for fault localization for cloud-native applications are provided herein. A computer-implemented method includes classifying an event-related alert directed to at least one system by processing one or more characteristics of the event-related alert; obtaining and processing multiple application logs based at least in part on the classification of the event-related alert; identifying error logs among the multiple application logs based at least in part on the processing of the multiple application logs; ordering the error logs using one or more prioritization techniques; and performing at least one automated action based at least in part on the ordering of the error logs.


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