The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2022

Filed:

Feb. 14, 2020
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Chen Qian, Beijing, CN;

Peng Lin, Beijing, CN;

Chuang Zhang, Beijing, CN;

Di Su, Beijing, CN;

Bin Yu, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/08 (2009.01); H04B 17/336 (2015.01); H04B 17/318 (2015.01); H04W 74/08 (2009.01); H04L 27/26 (2006.01); H04L 5/00 (2006.01);
U.S. Cl.
CPC ...
H04B 17/336 (2015.01); H04B 17/318 (2015.01); H04L 5/0007 (2013.01); H04L 27/2605 (2013.01); H04W 24/08 (2013.01); H04W 74/0833 (2013.01);
Abstract

A terminal device and a method for measuring cross-link interference. The method includes receiving time-frequency resource configuration information from a base station, wherein the time-frequency resource configuration information includes configuration information of measurement time-frequency resources for measuring the cross-link interference. The method also includes determining measurement time-frequency resources for measuring the cross-link interference according to the time-frequency resource configuration information. The method further includes measuring the cross-link interference on the measured time-frequency resources and feeding back the measurement result of the cross-link interference to the base station.


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