The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2022
Filed:
Jan. 17, 2020
Ciena Corporation, Hanover, MD (US);
Ciena Corporation, Hanover, MD (US);
Abstract
Systems and methods for a system-level Erbium-Doped Fiber Amplifier (EDFA) optical amplifier efficiency metric. The efficiency metric is a single metric that summarizes optical amplifier behavior and has a predictable behavior over various different optical amplifier settings. Specifically, the efficiency metric is simple and elegant. The simplicity is based on the fact the efficiency metric is determined from available data in an optical amplifier, not requiring external monitoring equipment, dithering, etc. The elegance is based on the fact the efficiency metric covers different optical amplifier settings, multiple pumps, etc. and is shown to reflect degradation with these differences in real-world systems accurately. Specifically, the efficiency metric is designed to reflect health in a multiple pump optical amplifier, providing a single value that represents the total pump currents across all of the multiple pumps.