The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2022

Filed:

Jul. 13, 2020
Applicant:

Ignis Innovation Inc., Waterloo, CA;

Inventors:

Nino Zahirovic, Waterloo, CA;

Shuenn-Jiun Tang, Guelph, CA;

Assignee:

Ignis Innovation Inc., Waterloo, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/3275 (2016.01); G09G 3/3208 (2016.01); G09G 3/20 (2006.01); G09G 5/10 (2006.01); H04N 5/57 (2006.01);
U.S. Cl.
CPC ...
G09G 3/3275 (2013.01); G09G 3/2096 (2013.01); G09G 3/3208 (2013.01); G09G 5/10 (2013.01); H04N 5/57 (2013.01); G09G 2300/0408 (2013.01); G09G 2320/0233 (2013.01); G09G 2320/0285 (2013.01); G09G 2320/043 (2013.01); G09G 2330/026 (2013.01); G09G 2330/08 (2013.01); G09G 2330/12 (2013.01); G09G 2360/08 (2013.01); G09G 2370/02 (2013.01); G09G 2370/04 (2013.01);
Abstract

Active-Matrix Organic Light-Emitting Diode (AMOLED) displays exhibit differences in luminance on a pixel to pixel basis, primarily as a result of process or construction inequalities, or from aging caused by operational use over time. To facilitate image correction, the initial non-uniformity correction data is obtained using methods, such as electrical measurement or a combination of electrical and optical measurement. Typically, the correction data is then stored on a non-volatile-memory chip on the display module itself. The proposed invention offers an alternate method for storing and loading the image correction data, thereby eliminating the need for memory chip in the display module.


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