The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2022

Filed:

Oct. 10, 2017
Applicant:

Insurance Services Office Inc., Jersey City, NJ (US);

Inventors:

Anurag Ghosh, Chhattisgarh, IN;

Dongmian Zou, Jiangsu Province, CN;

Maneesh Kumar Singh, Princeton, NJ (US);

Assignee:

Insurance Services Office, Inc., Jersey City, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/75 (2022.01); G06F 16/583 (2019.01); G06K 9/62 (2022.01); G06N 3/04 (2006.01); G06N 3/08 (2006.01); G06V 30/194 (2022.01); G06Q 50/26 (2012.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06V 10/758 (2022.01); G06F 16/5838 (2019.01); G06K 9/6274 (2013.01); G06K 9/6277 (2013.01); G06N 3/04 (2013.01); G06N 3/08 (2013.01); G06V 30/194 (2022.01); G06Q 50/26 (2013.01);
Abstract

Systems and methods for detection and localization of image and document forgery. The method can include the step of receiving a dataset having a plurality of authentic images and a plurality of manipulated images. The method can also include the step of benchmarking a plurality of image forgery algorithms using the dataset. The method can further include the step of generating a plurality of receiver operating characteristic (ROC) curves for each of the plurality of image forgery algorithms. The method also includes the step of calculating a plurality of area under curve metrics for each of the plurality of ROC curves. The method further includes the step of training a neural network for image forgery based on the plurality of area under curve metrics.


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