The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2022

Filed:

Sep. 20, 2019
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Chunfeng Yao, Beijing, CN;

Bailan Feng, Beijing, CN;

Defeng Li, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 10/00 (2022.01); G06V 20/10 (2022.01); G06V 10/50 (2022.01); G06V 10/44 (2022.01); G06V 40/10 (2022.01);
U.S. Cl.
CPC ...
G06V 10/50 (2022.01); G06V 10/44 (2022.01); G06V 20/10 (2022.01); G06V 40/103 (2022.01);
Abstract

A method and an apparatus for recognizing a descriptive attribute of an appearance feature include obtaining a location feature of an appearance feature of a target image to determine a location of a part of an object in a preset object model indicated by the appearance feature, where the location feature of the appearance feature indicates the location of the part of the object in the preset object model indicated by the appearance feature, recognizing a target region based on the location feature, where the target region includes the part of the object, performing feature analysis on the target region, recognizing a descriptive attribute of the appearance feature of the object, and determining the location feature of the appearance feature having a local attribute.


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