The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2022
Filed:
Feb. 26, 2020
Kabushiki Kaisha Toshiba, Minato-ku, JP;
Ryusuke Hirai, Setagaya, JP;
Kyoka Sugiura, Kawasaki, JP;
Yukinobu Sakata, Kawasaki, JP;
Akiyuki Tanizawa, Kawasaki, JP;
Kabushiki Kaisha Toshiba, Minato-ku, JP;
Abstract
A defect inspection device includes at least one memory storing instructions and at least one processor. The at least one processor is configured to execute the instructions to acquire a first image of an inspection target created in a first creation method, acquire a second image obtained by photographing the inspection target, extract index data similar to the acquired first image with reference to a database, the index data being a third image created in the first creation method or a feature quantity obtained by the third image, the database including the index data associated with correct data that is used as a comparison target of the index data and is an image determined not to be defective in previous inspection, acquire the correct data associated with the extracted index data in the database, generate a reference image on the basis of the acquired correct data, and estimate a pixel associated with a defective position on the inspection target photographed in the second image by comparing the reference image with the second image.