The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2022
Filed:
May. 15, 2020
Genpact Luxembourg S.à R.l. Ii, Luxembourg, LU;
Siva Tian, New York, NY (US);
Krishna Dev Oruganty, Long Island, NY (US);
Adrita Barari, Kolkata, IN;
Edmond Schneider, Henrico, VA (US);
Nitish Kumar, Dedham, MA (US);
Amit Arora, Princeton, NJ (US);
Vikram Mahidhar, Lexington, MA (US);
Chirag Jain, Bangalore, IN;
Abhilash Nvs, Bhubaneswar, IN;
Genpact Luxembourg S.à r.l. II, Luxembourg, LU;
Abstract
A method and system are provided for assessing damage to a structure. According to one embodiment, the method includes using a classifier that is trained to associate respective portions of in an image of a structure with respective external parts of the structure to detect several of external parts of a structure in a first image of the structure. The method also includes using a first machine learning system, trained to perform segmentation of an image, to identify one or more image segments in a second image, where each image segment represents damage of a particular type and, using a second machine learning system, trained to associate image segments with external parts identified in an image, to associate a first image segment with a first external part, indicating damage to the first external part.