The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2022

Filed:

Oct. 27, 2017
Applicant:

Accenture Global Solutions Limited, Dublin, IE;

Inventors:

Fang Hou, Beijing, CN;

Yikai Wu, Beijing, CN;

Xiaopei Cheng, Beijing, CN;

Guo Ma, Beijing, CN;

Guanyi Sun, Beijing, CN;

Bin Xie, Beijing, CN;

Hui Shen, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 13/02 (2006.01); G06Q 10/06 (2012.01); G06N 20/00 (2019.01); G06F 16/901 (2019.01); G05B 19/418 (2006.01); G06N 5/02 (2006.01); G06F 16/25 (2019.01); G06Q 10/10 (2012.01); G06Q 30/06 (2012.01);
U.S. Cl.
CPC ...
G06Q 10/067 (2013.01); G05B 19/4183 (2013.01); G05B 19/41875 (2013.01); G06F 16/25 (2019.01); G06F 16/9024 (2019.01); G06N 5/022 (2013.01); G06N 5/025 (2013.01); G06N 20/00 (2019.01); G06Q 10/10 (2013.01); G06Q 10/06 (2013.01); G06Q 10/0635 (2013.01); G06Q 30/0641 (2013.01);
Abstract

This disclosure relates to industrial data services, data modeling and applications for controlling an industrial operation. In one implementation, a platform is disclosed for allocating a data modeling request to a collaborative group of experts based on a two-dimensional data modeling flow data structure and a multilayer resource allocation graph to obtain a data model for controlling the industrial operation. The two-dimensional data modeling flow data structure and the multilayer resource allocation graph are established from an industrial graph knowledgebase using various data analytics and machine learning techniques.


Find Patent Forward Citations

Loading…