The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2022
Filed:
Jan. 31, 2017
Kabushiki Kaisha Toshiba, Tokyo, JP;
Takuro Moriyama, Kanagawa, JP;
Hideyuki Aisu, Kanagawa, JP;
Hisaaki Hatano, Kanagawa, JP;
Kenichi Fujiwara, Kanagawa, JP;
KABUSHIKI KAISHA TOSHIBA, Tokyo, JP;
Abstract
A bias estimation apparatus according to an embodiment estimates a bias included in a measured values by each sensor. The bias estimation apparatus includes a reference model builder, a temporary bias generator, a corrected measured value calculator, a similarity calculator, a similarity selector, a score calculator, and an estimated bias determiner. The reference model builder builds a reference model of the measured value packs. The temporary bias generator generates a temporary bias pack. The corrected measured value calculator calculates corrected measured value packs. The similarity calculator calculates a similarity of each corrected measured value pack. The similarity selector selects a part of the similarities according to their values from among the similarities. The score calculator calculates a score based on the selected similarities. The estimated bias determiner determines an estimated bias which is an estimated value of the bias based on the score.