The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2022
Filed:
Feb. 20, 2020
Nxp B.v., Eindhoven, NL;
Brian Ermans, 's-Hertogenbosch, NL;
Wilhelmus Petrus Adrianus Johannus Michiels, Reusel, NL;
Christine van Vredendaal, Veldhoven, NL;
NXP B.V., Eindhoven, NL;
Abstract
A method is provided for analyzing a classification in a machine learning model (ML). In the method, the ML model is trained using a training dataset to produce a trained ML model. One or more samples are provided to the trained ML model to produce one or more prediction classifications. A gradient is determined for the one of more samples at a predetermined layer of the trained ML model. The one or more gradients and the one or more prediction classifications for each sample are stored. Also, an intermediate value of the ML model may be stored. Then, a sample is chosen to analyze. A gradient of the sample is determined if the gradient was not already determined when the at least one gradient is determined. Using the at least one gradient, and one or more of a data structure, a predetermined metric, and an intermediate value, the k nearest neighbors to the sample are determined. A report comprising the sample and the k nearest neighbors may be provided for analysis.