The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2022
Filed:
Feb. 13, 2020
Applicant:
Vmware, Inc., Palo Alto, CA (US);
Inventors:
Assignee:
VMware, Inc., Palo Alto, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06F 21/62 (2013.01); G06F 21/31 (2013.01); G06F 21/57 (2013.01); G06F 21/78 (2013.01); G06F 21/44 (2013.01);
U.S. Cl.
CPC ...
G06F 21/6218 (2013.01); G06F 21/31 (2013.01); G06F 21/44 (2013.01); G06F 21/57 (2013.01); G06F 21/78 (2013.01);
Abstract
A feature selection methodology is disclosed. In a computer-implemented method, components of a computing environment are automatically monitored, and have a feature selection analysis performed thereon. Provided the feature selection analysis determines that features of the components are well defined, a classification of the features is performed. Provided the feature selection analysis determines that features of the components are not well-defined access to those features are discarded. Results of the feature selection methodology are generated.