The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2022

Filed:

Dec. 17, 2020
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Nicholas A Noto, Sunnyvale, CA (US);

Mariah Arevalo, Woodland, CA (US);

Philip Shilane, Newtown, PA (US);

Joseph S. Brandt, Salt Lake City, UT (US);

Assignee:

EMC IP HOLDING COMPANY LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/02 (2006.01); G06F 9/48 (2006.01); G06F 9/50 (2006.01); G06F 16/174 (2019.01);
U.S. Cl.
CPC ...
G06F 12/0253 (2013.01); G06F 9/4843 (2013.01); G06F 9/505 (2013.01); G06F 16/1744 (2019.01);
Abstract

Systems and methods for estimating the number of workers needed to perform a garbage collection operation are disclosed. Similarity groups are used to identify segments associated with objects in a computing system. Using deletion records that identify objects to be deleted, the similarity groups impacted by the deletion records can be identified. The number of workers can be determined based on the impacted similarity groups. More specifically, the number of impacted similarity groups and/or workers can be evaluated in terms of memory requirements, input/output constraints and/or time requirements to estimate the number or workers needed to clean similarity groups impacted by a garbage collection operation.


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