The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2022
Filed:
Jan. 13, 2020
Fujitsu Limited, Kawasaki, JP;
Junhee Park, San Jose, CA (US);
Athar Sefid, City College, PA (US);
Wei-Peng Chen, Fremont, CA (US);
FUJITSU LIMITED, Kawasaki, JP;
Abstract
A method for parameter value resolution, includes extracting, from an application programming interface (API) repository, metadata information associated with an API parameter set of at least one API and generating parameter clusters associated with the API parameter set based on the extracted metadata information. Each parameter cluster may include word tokens associated with at least one API parameter of the API parameters set. The method furthers includes determining a representative term for each parameter cluster and based on the determined representative term, extracting sample parameter values from a knowledge base server. The method further includes generating test API endpoints associated with the at least one API based on the extracted sample parameter values, validating the extracted sample parameter values by executing the generated test API endpoints, and publishing, based on the validation, validation result as an indicator for suitability of the at least one API for a software application.