The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2022

Filed:

Jun. 28, 2018
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Ryota Suzuki, Tokyo, JP;

Shigeru Koumoto, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0751 (2013.01);
Abstract

An anomaly determination apparatus, an anomaly determination method, and a program, capable of easily determining whether or not an anomaly has occurred are provided. An anomaly determination apparatus () includes a transformation unit () and an anomaly determination unit (). The transformation unit () performs a transformation process using a transform function for transforming an anomaly level of a signal into a probability variable value, the probability variable value being a variable value in accordance with a predetermined probability distribution. Note that the transform function is a monotone function. The anomaly determination unit () determines presence/absence of an anomaly of a sample of the anomaly level by using a result of the transformation by the transformation unit ().


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