The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2022
Filed:
Mar. 09, 2021
Kyndryl, Inc., New York, NY (US);
KYNDRYL, INC., New York, NY (US);
Abstract
In an approach for generating hardware failure labels, a processor receives sensor data from a plurality of sensors associated with a hardware system. A processor calculates an adaptive stress factor, wherein the adaptive stress factor is a dynamic selection model. A processor calculates an adaptive stress time window, wherein the adaptive stress time window is a spatial distribution of the adaptive stress factor. A processor calculates a relative duty cycle, wherein the relative duty cycle is a first function of an internal state of the hardware system, a type of input to the hardware system, the adaptive stress factor, and the adaptive stress time window. A processor generates a failure label, wherein the failure label is calculated as a second function of the relative duty cycle and a design duty cycle.