The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2022

Filed:

Aug. 24, 2017
Applicant:

Molecular Devices, Llc, San Jose, CA (US);

Inventor:

Paula Karen Gedraitis, Hopkinton, MA (US);

Assignee:

Molecular Devices, LLC, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G06T 7/73 (2017.01); G06T 7/11 (2017.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G06T 7/11 (2017.01); G06T 7/74 (2017.01); G06T 2207/10056 (2013.01);
Abstract

A template-based image analysis system and method are disclosed. A slide is loaded in a high-content image system (HCIS), wherein the slide includes a plurality of reference marks and a plurality of sample locations. An acquired images data store has previously acquired images stored therein. An image acquisition module acquires an image of the slide from the high-content imaging system. A feature identification module develops a binary image of the acquired image, wherein the binary image identifies areas associated with reference marks. A template generation module generates a template in accordance with the previously acquired images and a template alignment module aligns the generate template with the binary image. An offset calculation module determines an offset between the template and the binary image and an image segmentation module determines the coordinates of pixels of the acquired image that are associated with the sample locations in accordance with the calculated offset.


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