The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2022

Filed:

Sep. 29, 2015
Applicants:

Linfeng BI, Houston, TX (US);

Xiaohui Wu, Sugar Land, TX (US);

Larisa Branets, Conroe, TX (US);

Inventors:

Linfeng Bi, Houston, TX (US);

Xiaohui Wu, Sugar Land, TX (US);

Larisa Branets, Conroe, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 17/05 (2011.01); G01V 99/00 (2009.01); G06F 30/20 (2020.01);
U.S. Cl.
CPC ...
G01V 99/005 (2013.01); G06F 30/20 (2020.01); G06T 17/05 (2013.01); G01V 2210/66 (2013.01);
Abstract

Method for constructing a continuous design space for generating a physical property model in a faulted subsurface medium. The matching relationship of the fault traces on the two sides of each fault is used in a systematic way to determine the location of the fault traces in the design space. The location of any other point in the design space may then be determined by interpolation of the locations of fault traces. The fault traces are thus used as control points for the mapping. The method involves: (a) identifying the control points and determining their location in both physical and design space and (b) using selected control points, mapping any point from physical space to design space, preferably using the moving least squares method.


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