The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2022
Filed:
Aug. 18, 2020
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventors:
Jose Flores, Richardson, TX (US);
Rama Venkatasubramanian, Plano, TX (US);
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3177 (2006.01); H03K 3/037 (2006.01); G01R 31/317 (2006.01); H03K 19/21 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 31/31703 (2013.01); G01R 31/31723 (2013.01); G01R 31/31725 (2013.01); H03K 3/0372 (2013.01); H03K 19/21 (2013.01);
Abstract
In described examples, a latch includes active feedback circuitry for latching input information. A comparison of logic states between input and output states at selected times can determine whether, for example, the latch has correctly retained latch data. The latch can optionally be included within a scan chain, provide asynchronous latch error notifications, and/or synchronous notifications indicating where in the scan chain a latch error occurred.