The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2022
Filed:
Apr. 25, 2019
Fukuda Co., Ltd., Tokyo, JP;
Yasuhiko Higuchi, Tokyo, JP;
Masakazu Ito, Tokyo, JP;
Yuho Matsui, Tokyo, JP;
Mao Hirata, Tokyo, JP;
Fukuda Co., Ltd., Tokyo, JP;
Abstract
It is an object of the present invention to enhance reliability of an allowable limit conductance used for setting a threshold value for evaluating sealability of a test object, and further, enhance reliability of the sealability evaluation. By leak testing a test objectA with a sealing defect, a leakage characteristic that shows a relationship between an internal-external pressure difference and a leak flow rate is obtained. A conductance of a test object with a similar artificial leakB having a similar artificial leak devicedisposed therein, conducting the leak-detected substance is measured. The similar artificial leak devicehas a leakage characteristic similar to the obtained leakage characteristic. An allowable limit conductance is obtained based on results of the measurement. Sealability of a test objectis evaluated based on a threshold value set with a standard artificial leak deviceS having the allowable limit conductance.